Aehr Test Systems PEG

Quel est le PEG de Aehr Test Systems?

Le PEG de Aehr Test Systems est 1.01

Quelle est la définition de PEG ?



Le ratio cours / bénéfice sur croissance (PEG) est le ratio P/E d'une action divisé par le taux de croissance de ses bénéfices prévu pour une période de 5 ans.

The PEG ratio is calculated by dividing the P/E ratio by the company's expected earnings growth rate in the next 5 years. Since using just the P/E ratio would make high-growth companies appear overvalued relative to others, the PEG ratio is considered to be a convenient approximation. PEG is a widely employed indicator of a stock's possible true value.

Similar to P/E ratios, a lower PEG means that the stock is undervalued more. It is favored by many over the price/earnings ratio because it also accounts for growth. The PEG ratio of 1 is sometimes said to represent a fair trade-off between the values of cost and the values of growth, indicating that a stock is reasonably valued given the expected growth. A crude analysis suggests that companies with PEG values between 0 and 1 may provide higher returns. A PEG Ratio can also be a negative number if a stock's present income figure is negative, (negative earnings) or if future earnings are expected to drop (negative growth). PEG ratios calculated from negative present earnings are viewed with skepticism as almost meaningless, other than as an indication of high investment risk.

PEG des entreprises dans Technology secteur sur NASDAQ par rapport à Aehr Test Systems

Que fait Aehr Test Systems?

headquartered in fremont, california, aehr test systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. aehr test has developed and introduced several innovative products, including the abts, foxtm and max systems and the diepak® carrier. the abts system is aehr test’s newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. the fox system is a full wafer contact test and burn-in system. the max system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. the diepak carrier is a reusable, temporary package that enables ic manufacturers to perform cost-effective final test and burn-in of bare die.

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